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1 caution: these devices are sensitive to electrostatic discharge; follow proper ic handling procedures. 1-888-intersil or 1-888-468-3774 | copyright intersil americas inc. 2011. all rights reserved intersil (and design) and femtocharge are trademarks owned by intersil corporation or one of its subsidiaries. all other trademarks mentioned are the property of their respective owners. 16-bit, 250msps/200msps/130msps adc ISLA216P the ISLA216P is a family of low power, high performance 16-bit analog-to-digital converte rs. designed with intersil?s proprietary femtocharge? technology on a standard cmos process, the family supports sampling rates of up to 250msps. the ISLA216P is part of a pin-compatible portfolio of 12 to 16-bit a/ds with maximum sample rates ranging from 130msps to 500msps. a serial peripheral interface (spi) port allows for extensive configurability, as well as fine control of various parameters such as gain and offset. digital output data is presented in selectable lvds or cmos formats. the ISLA216P is available in a 72-contact qfn package with an exposed paddle. operating from a 1.8v supply, performance is specified over the full industrial temperature range (-40c to +85c). key specifications ? snr @ 250/200/130msps ? 75.0/76.6/77.5dbfs f in = 30mhz ? 72.1/72.6/72.4dbfs f in = 363mhz ? sfdr @ 250/200/130msps ?87/91/96dbc f in = 30mhz ? 81/80/82dbc f in = 363mhz ? total power consumption = 786mw @ 250msps features ? single supply 1.8v operation ? clock duty cycle stabilizer ? 75fs clock jitter ? 700mhz bandwidth ? programmable built-in test patterns ?multi-adc support ? spi programmable fine gain and offset control ? support for multiple adc synchronization ? optimized output timing ? nap and sleep modes ? 200 s sleep wake-up time ? data output clock ? ddr lvds-compatible or lvcmos outputs ? user-accessible digital temperature monitor applications ? radar array processing ? software defined radios ? broadband communications ? high-performance data acquisition ? communications test equipment digital error correction vinp vinn clock management sha 16-bit 250 msps adc clkp clkn spi control csb sclk sdio ovss avss avdd clkoutp clkoutn d[14:0]p d[14:0]n ovdd clkdiv rlvds sdo + ? vcm resetn clkdivrstp clkdivrstn napslp pin-compatible family model resolution speed (msps) ISLA216P25 16 250 ISLA216P20 16 200 ISLA216P13 16 130 isla214p50 14 500 isla214p25 14 250 isla214p20 14 200 isla214p13 14 130 isla212p50 12 500 isla212p25 12 250 isla212p20 12 200 isla212p13 12 130 january 13, 2011 fn7574.0
ISLA216P 2 fn7574.0 january 13, 2011 pin configuration - lvds mode ISLA216P (72 ld qfn) top view avdd avdd avdd sdio 72 71 70 69 68 67 66 65 64 63 62 61 sclk csb sdo ovss d0p d0n ovdd ovss 60 59 d2p d2n dnc dnc d6p d6n dnc dnc clkoutp clkoutn rlvds ovss d8p d8n dnc dnc 1 2 3 4 5 6 7 8 9 10 11 12 13 14 54 53 52 51 50 49 48 47 46 45 44 43 42 41 dnc dnc napslp vcm avss avdd avss vinn vinn vinp vinp avss avdd avss 19 20 21 22 23 24 25 26 27 28 29 30 31 32 avdd avdd avdd clkp clkn clkdivrstp clkdivrstn ovss ovdd dnc dnc d14n d14p ovdd 15 16 17 18 clkdiv iptat dnc resetn 33 34 35 36 dnc dnc d12n d12p d10p d10n dnc dnc 40 39 38 37 58 57 dnc dnc 56 55 d4p d4n connect thermal pad to avss thermal pad not drawn to scale, consult mechanical drawing for physical dimensions pin descriptions - 72 ld qfn, lvds mode pin number lvds pin na me lvds pin function 1, 2, 17, 28, 29, 33, 34, 37, 38, 41, 42, 49, 50, 53, 54, 57, 58 dnc do not connect 6, 13, 19, 20, 21, 70, 71, 72 avdd 1.8v analog supply 5, 7, 12, 14 avss analog ground 27, 32, 62 ovdd 1.8v output supply 26, 45, 61, 65 ovss output ground 3 napslp tri-level power control (nap, sleep modes)
ISLA216P 3 fn7574.0 january 13, 2011 4 vcm common mode output 8, 9 vinn analog input negative 10, 11 vinp analog input positive 15 clkdiv tri-level clock divider control 16 iptat temperature monitor (output current proportional to absolute temperature) 18 resetn power on reset (active low) 22, 23 clkp, clkn clock input true, complement 24, 25 clkdivrstp, clkdivrstn synchronous clock divider reset true, complement 30 d14n ddr logical bits 14, 15 complement 31 d14p ddr logical bits 14, 15 true 35 d12n ddr logical bits 12, 13 complement 36 d12p ddr logical bits 12, 13 true 39 d10n ddr logical bits 10, 11 complement 40 d10p ddr logical bits 10, 11 true 43 d8n ddr logical bits 8, 9 complement 44 d8p ddr logical bits 8, 9 true 46 rlvds lvds bias resistor (connect to ovss with 1%10k ) 47, 48 clkoutn, clkoutp lvds clock output complement, true 51 d6n ddr logical bits 6, 7 complement 52 d6p ddr logical bits 6, 7 true 55 d4n ddr logical bits 4, 5 complement 56 d4p ddr logical bits 4, 5 true 59 d2n ddr logical bits 2, 3 complement 60 d2p ddr logical bits 2, 3 true 63 d0n ddr logical bits 0, 1 complement 64 d0p ddr logical bits 0, 1 true 66 sdo spi serial data output 67 csb spi chip select (active low) 68 sclk spi clock 69 sdio spi serial data input/output exposed paddle avss analog ground pin descriptions - 72 ld qfn, lvds mode (continued) pin number lvds pin na me lvds pin function
ISLA216P 4 fn7574.0 january 13, 2011 pin configuration - cmos mode ISLA216P (72 ld qfn) top view avdd avdd avdd sdio 72 71 70 69 68 67 66 65 64 63 62 61 sclk csb sdo ovss d0 dnc ovdd ovss 60 59 d2 dnc dnc dnc d6 dnc dnc dnc clkout dnc rlvds ovss d8 dnc dnc dnc 1 2 3 4 5 6 7 8 9 10 11 12 13 14 54 53 52 51 50 49 48 47 46 45 44 43 42 41 dnc dnc napslp vcm avss avdd avss vinn vinn vinp vinp avss avdd avss 19 20 21 22 23 24 25 26 27 28 29 30 31 32 avdd avdd avdd clkp clkn clkdivrstp clkdivrstn ovss ovdd dnc dnc dnc d14 ovdd 15 16 17 18 clkdiv iptat dnc resetn 33 34 35 36 dnc dnc dnc d12 d10 dnc dnc dnc 40 39 38 37 58 57 dnc dnc 56 55 d4 dnc connect thermal pad to avss consult mechanical drawing for physical dimensions thermal pad not drawn to scale, pin descriptions - 72 ld qfn, cmos mode pin number cmos pin name cmos pin function 1, 2, 17, 28, 29, 30, 33, 34, 35, 37, 38, 39, 41, 42, 43, 47, 49, 50, 51, 53, 54, 55, 57, 58, 59, 63 dnc do not connect 6, 13, 19, 20, 21, 70, 71, 72 avdd 1.8v analog supply 5, 7, 12, 14 avss analog ground 27, 32, 62 ovdd 1.8v output supply 26, 45, 61, 65 ovss output ground 3 napslp tri-level power control (nap, sleep modes)
ISLA216P 5 fn7574.0 january 13, 2011 4 vcm common mode output 8, 9 vinn analog input negative 10, 11 vinp analog input positive 15 clkdiv tri-level clock divider control 16 iptat temperature monitor (output current proportional to absolute temperature) 18 resetn power on reset (active low) 22, 23 clkp, clkn clock input true, complement 24, 25 clkdivrstp, clkdivrstn synchronous clock divider reset true, complement 31 d14 ddr logical bits 14, 15 36 d12 ddr logical bits 12, 13 40 d10 ddr logical bits 10, 11 44 d8 ddr logical bits 8, 9 46 rlvds lvds bias resistor (connect to ovss with 1%10k ) 48 clkout cmos clock output 52 d6 ddr logical bits 6, 7 56 d4 ddr logical bits 4, 5 60 d2 ddr logical bits 2, 3 64 d0 ddr logical bits 0, 1 66 sdo spi serial data output 67 csb spi chip select (active low) 68 sclk spi clock 69 sdio spi serial data input/output exposed paddle avss analog ground pin descriptions - 72 ld qfn, cmos mode (continued) pin number cmos pin name cmos pin function ordering information part number (notes 1, 2) part marking temp. range (c) package (pb-free) pkg. dwg. # ISLA216P13irz ISLA216P13 irz -40c to +85c 72 ld qfn l72.10x10e ISLA216P20irz ISLA216P20 irz -40c to +85c 72 ld qfn l72.10x10e ISLA216P25irz ISLA216P25 irz -40c to +85c 72 ld qfn l72.10x10e coming soon ISLA216P13ir1z ISLA216P13 ir1z -40c to +85c 48 ld qfn tbd coming soon ISLA216P20ir1z ISLA216P20 ir1z -40c to +85c 48 ld qfn tbd coming soon ISLA216P25ir1z ISLA216P25 ir1z -40c to +85c 48 ld qfn tbd ISLA216P25eval evaluation board notes: 1. these intersil pb-free plastic packaged products employ specia l pb-free material sets; molding compounds/die attach materials and nipdau plate-e4 termination finish, which is rohs compliant and compatible with both snpb and pb-free soldering operations. intersil pb-free pr oducts are msl classified at pb-free peak reflow temp eratures that meet or exceed the pb-fr ee requirements of ipc/jedec j std-020. 2. for moisture sensitivity level (msl), please see device information page for ISLA216P . for more information on msl please see techbrief tb363 .
ISLA216P 6 fn7574.0 january 13, 2011 table of contents pin-compatible family . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 - lvds mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 pin descriptions - 72 ld qfn, lvds mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 pin descriptions - 72 ld qfn, cmos mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 absolute maximum ratings. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 thermal information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 electrical specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 digital specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 timing diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 switching specifications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 typical performance curves. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 theory of operation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 power-on calibration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 user initiated reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 temperature calibration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 analog input . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 clock input . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 jitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 voltage reference . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 digital outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 power dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 nap/sleep. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 data format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 clock divider synchronous reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 serial peripheral interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 spi physical interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 spi configuration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 device information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 device configuration/control. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 global device configuration/cont rol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 digital temperature sensor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 spi memory map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 equivalent circuits. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 a/d evaluation platform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 layout considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 split ground and power planes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 clock input considerations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 exposed paddle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 bypass and filtering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 lvds outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 lvcmos outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 unused inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 products . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 package outline drawing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
ISLA216P 7 fn7574.0 january 13, 2011 absolute maximum rating s thermal information avdd to avss . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-0.4v to 2.1v ovdd to ovss . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-0.4v to 2.1v avss to ovss . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3v to 0.3v analog inputs to avss . . . . . . . . . . . . . . . . . . . . . . . . . -0.4v to avdd + 0.3v clock inputs to avss . . . . . . . . . . . . . . . . . . . . . . . . . . -0.4v to avdd + 0.3v logic input to avss . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.4v to ovdd + 0.3v logic inputs to ovss . . . . . . . . . . . . . . . . . . . . . . . . . . -0.4v to ovdd + 0.3v latchup (tested per jesd-78c;class 2,level a) . . . . . . . . . . . . . . . . 100ma thermal resistance (typical) ja (c/w) jc (c/w) 72 ld qfn (notes 3, 4) . . . . . . . . . . . . . . . . 23 0.9 48 ld qfn (notes 3, 4) . . . . . . . . . . . . . . . . 24 1.0 operating temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -40c to +85c storage temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-65c to +150c junction temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+150c pb-free reflow profile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . see link below http://www.intersil.com/ pbfree/pb-freereflow.asp caution: do not operate at or near the maximum ratings listed for extended periods of time. exposure to such conditions may adv ersely impact product reliability and result in failures not covered by warranty. notes: 3. ja is measured in free air with the componen t mounted on a high effective thermal conduc tivity test board with ?direct attach? fe atures. see tech brief tb379. 4. for jc , the ?case temp? location is the center of the exposed metal pad on the package underside. electrical specifications all specifications apply under the following co nditions unless otherwise noted: avdd = 1.8v, ovdd = 1.8v, t a = -40c to +85c (typical specifications at +25c), a in = -2dbfs, f sample = maximum conversion rate (per speed grade). boldface limits apply over the operat ing temperature range, -40c to +85c. parameter symbol conditions ISLA216P25 ISLA216P20 ISLA216P13 units min (note 5) typ max (note 5) min (note 5) typ max (note 5) min (note 5) typ max (note 5) dc specifications (note 6) analog input full-scale analog input range v fs differential 1.95 2.0 2.2 1.95 2.0 2.2 1.95 2.0 2.2 v p-p input resistance r in differential 300 300 300 input capacitance c in differential 9 9 9 pf full scale range temp. drift a vtc full temp 180 180 180 ppm/c input offset voltage v os -5.0 -1.7 5.0 -5.0 -1.7 5.0 -5.0 -1.7 5.0 mv common-mode output voltage v cm 0.94 0.94 0.94 v common-mode input current (per pin) i cm 10.8 10.8 10.8 a/msps clock inputs inputs common mode voltage 0.9 0.9 0.9 v clkp,clkn input swing 1.8 1.8 1.8 v power requirements 1.8v analog supply voltage avdd 1.7 1.8 1.9 1.7 1.8 1.9 1.7 1.8 1.9 v 1.8v digital supply voltage ovdd 1.7 1.8 1.9 1.7 1.8 1.9 1.7 1.8 1.9 v 1.8v analog supply current i avdd 372 397 342 360 293 310 ma 1.8v digital supply current (note 6) i ovdd 3ma lvds 64 73 58 68 50 58 ma power supply rejection ratio psrr 30mhz, 50mvp-p signal on avdd -65 -65 -65 db
ISLA216P 8 fn7574.0 january 13, 2011 total power dissipation normal mode p d 2ma lvds 771 706 603 mw 3ma lvds 786 846 720 770 616 662 mw nap mode p d 88 103 83 99 77 94 mw sleep mode p d csb at logic high 7 19 7 19 7 19 mw nap/sleep mode wakeup time sample clock running 200 400 630 s ac specifications differential nonlinearity dnl f in = 30mhz no missing codes -0.99 0.35 -0.99 0.25 -0.99 0.25 lsb integral nonlinearity inl f in = 30mhz 10 6 5 lsb minimum conversion rate (note 7) f s min 40 40 40 msps maximum conversion rate f s max 250 200 130 msps signal-to-noise ratio (note 8) snr f in = 30mhz 75.0 76.6 77.5 dbfs f in = 105mhz 71.7 74.9 74.8 76.4 75.5 76.9 dbfs f in = 190mhz 74.2 75.3 75.3 dbfs f in = 363mhz 72.1 72.6 72.4 dbfs f in = 461mhz 71.1 71.1 70.8 dbfs f in = 605mhz 69.2 69.2 68.9 dbfs signal-to-noise and distortion (note 8) sinad f in = 30mhz 74.7 76.5 77.4 dbfs f in = 105mhz 70.0 74.1 73.2 76.1 72.6 76.1 dbfs f in = 190mhz 73.1 74.7 74.6 dbfs f in = 363mhz 71.6 71.7 71.9 dbfs f in = 461mhz 69.2 68.6 67.9 dbfs f in = 605mhz 65.7 64.9 66.3 dbfs effective number of bits (note 8) enob f in = 30mhz 12.12 12.42 12.56 bits f in = 105mhz 11.34 12.02 11.87 12.35 11.77 12.35 bits f in = 190mhz 11.85 12.12 12.10 bits f in = 363mhz 11.60 11.62 11.65 bits f in = 461mhz 11.20 11.10 10.99 bits f in = 605mhz 10.62 10.49 10.72 bits electrical specifications all specifications apply under the following co nditions unless otherwise noted: avdd = 1.8v, ovdd = 1.8v, t a = -40c to +85c (typical specifications at +25c), a in = -2dbfs, f sample = maximum conversion rate (per speed grade). boldface limits apply over the operat ing temperature range, -40c to +85c. (continued) parameter symbol conditions ISLA216P25 ISLA216P20 ISLA216P13 units min (note 5) typ max (note 5) min (note 5) typ max (note 5) min (note 5) typ max (note 5)
ISLA216P 9 fn7574.0 january 13, 2011 spurious-free dynamic range (note 8) sfdr f in = 30mhz 87 91 96 dbc f in = 105mhz 74 83 74 89 72 83 dbc f in = 190mhz 81 84 83 dbc f in = 363mhz 81 80 82 dbc f in = 461mhz 73 72 70 dbc f in = 605mhz 67 67 67 dbc spurious-free dynamic range excluding h2, h3 (note 8) sfdrx23 f in = 30mhz 89 91 99 dbc f in = 105mhz 80 92 82 93 82 96 dbc f in = 190mhz 88 92 96 dbc f in = 363mhz 83 87 94 dbc f in = 461mhz 82 85 91 dbc f in = 605mhz 79 82 89 dbc intermodulation distortion imd f in = 70mhz 94 92 88 dbfs f in = 170mhz 87 87 87 dbfs word error rate wer 10 -12 10 -12 10 -12 full power bandwidth fpbw 700 700 700 mhz notes: 5. compliance to datasheet limits is assu red by one or more methods: production test, characterization and/or design. 6. digital supply current is dependent upon the capacitive loading of the digital outputs. i ovdd specifications apply for 10pf load on each digital output. 7. the dll range setting must be changed for low-speed operation. 8. minimum specification guaranteed when calibrated at +85c. electrical specifications all specifications apply under the following co nditions unless otherwise noted: avdd = 1.8v, ovdd = 1.8v, t a = -40c to +85c (typical specifications at +25c), a in = -2dbfs, f sample = maximum conversion rate (per speed grade). boldface limits apply over the operat ing temperature range, -40c to +85c. (continued) parameter symbol conditions ISLA216P25 ISLA216P20 ISLA216P13 units min (note 5) typ max (note 5) min (note 5) typ max (note 5) min (note 5) typ max (note 5) digital specifications boldface limits apply over the operat ing temperature range, -40c to +85c. parameter symbol conditions min (note 5) typ max (note 5) units inputs input current high (resetn) i ih v in = 1.8v 0 1 10 a input current low (resetn) i il v in = 0v -25 -12 -7 a input current high (sdio) i ih v in = 1.8v 4 12 a input current low (sdio) i il v in = 0v -600 -415 -300 a input current high (csb) i ih v in = 1.8v 40 58 75 a input current low (csb) i il v in = 0v 5 10 a input voltage high (sdio, resetn) v ih 1.17 v input voltage low (sdio, resetn) v il 0.63 v input current high (clkdiv) (note 9) i ih 16 25 34 a input current low (clkdiv) i il -34 -25 -16 a input capacitance c di 3pf
ISLA216P 10 fn7574.0 january 13, 2011 lvds inputs (clkrstp,clkrstn) input common mode range v icm 825 1575 mv input differential swing (peak to peak, single-ended) v id 250 450 mv clkdivrstp input pull-down resistance r ipd 100 k clkdivrstn input pull-up resistance r ipu 100 k lvds outputs differential output voltage (note 10) v t 3ma mode 612 mv p-p output offset voltage v os 3ma mode 1120 1150 1200 mv output rise time t r 240 ps output fall time t f 240 ps cmos outputs voltage output high v oh i oh = -500a ovdd - 0.3 ovdd - 0.1 v voltage output low v ol i ol = 1ma 0.1 0.3 v output rise time t r 1.8 ns output fall time t f 1.4 ns notes: 9. the tri-level inputs internal switching thresholds are approxim ately. 0.43v and 1.34v. it is advised to float the inputs, tie to ground or avdd depending on desired function. 10. the voltage is expressed in peak-to-peak differential swing. the peak-to-peak singled-ended swing is 1/2 of the differential swing. digital specifications boldface limits apply over the operat ing temperature range, -40c to +85c. (continued) parameter symbol conditions min (note 5) typ max (note 5) units timing diagrams figure 1a. lvds clkn clkp inp inn t a clkoutn clkoutp t cpd latency = l cycles t dc t pd odd n-l even n-l odd n-l+1 even n-l+1 even n-1 odd n even n d[14/12/?/2/0]n d[14/12/?/2/0]p
ISLA216P 11 fn7574.0 january 13, 2011 figure 1b. cmos figure 1. timing diagrams timing diagrams clkn clkp inp inn t a clkout t cpd latency = l cycles t dc t pd odd n-l even n-l odd n-l+1 even n-l+1 even n-1 odd n even n d[14/12/?/2/0] switching specifications boldface limits apply over the operat ing temperature rang e, -40c to +85c. parameter symbol condition min (note 5) typ max (note 5) units adc output aperture delay t a 114 ps rms aperture jitter j a 75 fs input clock to output clock propagation delay t cpd avdd, ovdd = 1.7v to 1.9v, t a = -40c to +85c 1.65 2.4 3 ns t cpd avdd, ovdd = 1.8v, t a = +25c 1.9 2.3 2.75 ns relative input clock to output clock propagation delay (note 13) dt cpd avdd, ovdd = 1.7v to 1.9v, t a = -40c to +85c -450 450 ps input clock to data propagation delay t pd 1.65 2.4 3.5 ns output clock to data propagation delay, lvds mode t dc rising/falling edge -0.1 0.16 0.5 ns output clock to data propagation delay, cmos mode t dc rising/falling edge -0.1 0.2 0.65 ns synchronous clock divider reset setup time (with respect to the positive edge of clkp) t rsts 0.4 0.06 ns synchronous clock divider reset hold time (with respect to the positive edge of clkp) t rsth 0.02 0.35 ns synchronous clock divider reset recovery time t rstrt dll recovery time after synchronous reset 52 s latency (pipeline delay) l 10 cycles
ISLA216P 12 fn7574.0 january 13, 2011 overvoltage recovery t ovr 1cycles spi interface (notes 11, 12) sclk period t clk write operation 16 cycles t clk read operation 16 cycles csb to sclk setup time t s read or write 28 cycles csb after sclk hold time t h write 5 cycles data valid to sclk setup time t ds write 6 cycles data valid after sclk hold time t dh read or write 4 cycles data valid after sclk time t dvr read 5 cycles notes: 11. spi interface timing is directly pr oportional to the adc sample period (t s ). values above reflect multiples of a 4ns sample period, and must be scaled proportionally for lower sample rates. adc sample clock must be running for spi communication. 12. the spi may operate asynchronously wi th respect to the adc sample clock. 13. the relative propagation delay is the difference in propagat ion time between any two devices that are matched in temperature and voltage, and is specified over the full operating temperature and voltage range. switching specifications boldface limits apply over the operat ing temperature rang e, -40c to +85c. (continued) parameter symbol condition min (note 5) typ max (note 5) units typical performance curves all typical performance characteristics apply under the follow ing conditions unless otherwise noted: avdd = ovdd = 1.8v, t a = +25c, a in =-2dbfs, f in = 105mhz, f sample = 250msps. figure 2. snr and sfdr vs f in figure 3. hd2 and hd3 vs f in figure 4. snr and sfdr vs a in figure 5. hd2 and hd3 vs a in 60 65 70 75 80 85 90 95 0 100 200 300 400 500 600 s n r ( d b f s ) a n d s f d r ( d b c ) input frequency (mhz) sfdr @ 130msps sfdr @ 250msps snr @ 130msps snr @ 250msps -105 -100 -95 -90 -85 -80 -75 -70 -65 0 100 200 300 400 500 600 h d 2 a n d h d 3 m a g n i tu r e ( db c ) input frequency (mhz) hd2 @ 250msps hd3 @ 250msps hd2 @ 130msps hd3 @ 130msps 10 20 30 40 50 60 70 80 90 100 -60-50-40-30-20-10 0 s n r a n d s fd r input amplitude (dbfs) snr(dbc) sfdr(dbfs) snr(dbfs) sfdr(dbc) -110 -100 -90 -80 -70 -60 -50 -40 -60 -50 -40 -30 -20 -10 0 h d 2 a n d h d 3 m a g n i tu d e input amplitude (dbfs) hd3 (dbc) hd2 (dbfs) hd3 (dbfs) hd2 (dbc)
ISLA216P 13 fn7574.0 january 13, 2011 figure 6. snr and sfdr vs f sample figure 7. hd2 and hd3 vs f sample figure 8. power vs f sample in 3ma lvds mode figure 9. differential nonlinearity figure 10. integral nonlinearity figure 11. snr and sfdr vs vcm typical performance curves all typical performance characteristics apply under the follow ing conditions unless otherwise noted: avdd = ovdd = 1.8v, t a = +25c, a in =-2dbfs, f in = 105mhz, f sample = 250msps. (continued) 70 75 80 85 90 70 90 110 130 150 170 190 210 230 250 sample rate (msps) sfdr snr snr (dbfs) and sfdr (dbc) -105 -100 -95 -90 -85 -80 -75 70 90 110 130 150 170 190 210 230 250 sample rate (msps) hd2 and hd3 magnitude (dbc) h3 h2 450 500 550 600 650 700 750 800 40 60 80 100 120 140 160 180 200 220 240 sample rate (msps) total power (mw) 0 10,000 20,000 30,000 40,000 50,000 60,000 -1.5 -1.0 -0.5 0 0.5 1.0 1.5 codes d n l ( l s b s ) 0 -20 -15 -10 -5 0 5 10 15 20 30,000 10,000 20,000 40,000 50,000 60,000 codes inl (lsbs) 60 65 70 75 80 85 0.75 0.85 0.95 1.05 1.15 input common mode (v) snr (dbfs) and sfdr (dbc) snr sfdr
ISLA216P 14 fn7574.0 january 13, 2011 figure 12. noise histogram figure 13. single-tone spectrum @ 105mhz figure 14. single-tone spectrum @ 190mhz figure 15. single-tone spectrum @ 363mhz figure 16. two-tone spectrum (f1 = 70mhz, f2 = 71mhz at -7dbfs) figure 17. two-tone spectrum (f1 = 170mhz, f2 = 171mhz at -7dbfs) typical performance curves all typical performance characteristics apply under the follow ing conditions unless otherwise noted: avdd = ovdd = 1.8v, t a = +25c, a in =-2dbfs, f in = 105mhz, f sample = 250msps. (continued) 0 5000 10000 15000 20000 25000 32696 32700 32704 32708 32712 32716 32720 32724 code number of hits 0 20 40 60 80 100 120 -120 -100 -80 -60 -40 -20 0 frequency (mhz) amplitude (dbfs) a in = -2 dbfs snr = 75.4 dbfs sfdr = 82 dbc sinad = 74.5 dbfs 0 20 40 60 80 100 120 -120 -100 -80 -60 -40 -20 0 frequency (mhz) amplitude (dbfs) a in = -2 dbfs snr = 74.5 dbfs sfdr = 81 dbc sinad = 73.67 dbfs 0 20 40 60 80 100 120 -120 -100 -80 -60 -40 -20 0 frequency (mhz) amplitude (dbfs) a in = -2 dbfs snr = 72.4 dbfs sfdr = 80 dbc sinad = 71.3 dbfs 0 20 40 60 80 100 120 -120 -100 -80 -60 -40 -20 0 frequency (mhz) imd2 imd3 2nd harmonics 3rd harmonics amplitude (dbfs) imd3 = -94dbfs 0 20 40 60 80 100 120 -120 -100 -80 -60 -40 -20 0 frequency (mhz) amplitude (dbfs) imd3 = -87dbfs imd2 imd3 2nd harmonics 3rd harmonics
ISLA216P 15 fn7574.0 january 13, 2011 theory of operation functional description the ISLA216P25 is based upon a 16-bit, 250msps a/d converter core that utilizes a pipelined successive approximation architecture (figure 18). the in put voltage is captured by a sample-hold amplifier (sha) and converted to a unit of charge. proprietary charge-domain techniques are used to successively compare the input to a series of reference charges. decisions made during the successive appr oximation operations determine the digital code for each input valu e. digital error correction is also applied, resulting in a total late ncy of 10 clock cycles. this is evident to the user as a latency between the start of a conversion and the data being available on the digital outputs. power-on calibration as mentioned previously, the cores perform a self-calibration at start-up. an internal power-on-reset (por) circuit detects the supply voltage ramps and initiates the calibration when the analog and digital supply voltag es are above a threshold. the following conditions must be adhered to for the power-on calibration to execute successfully: ? a frequency-stable conversion clock must be applied to the clkp/clkn pins ? dnc pins must not be connected ? sdo has an internal pull-up and should not be driven externally ? resetn is pulled low by the adc internally during por. external driving of resetn is optional. ? spi communications must not be attempted a user-initiated reset can subsequently be invoked in the event that the above conditions cannot be met at power-up. after the power supply has stabilized the internal por releases resetn and an internal pull-up pulls it high, which starts the calibration sequence. if a subseq uent user-initiated reset is desired, the resetn pin should be connected to an open-drain driver with an off-state/high impedance state leakage of less than 0.5ma to assure exit from the reset state so calibration can start. the calibration sequence is initiated on the rising edge of resetn, as shown in figure 19. calibration status can be determined by reading the cal_status bit (lsb) at 0xb6. this bit is ?0? during calibration and goes to a logic ?1? when calibration is complete. the data outputs produce 0xcccc during calibration; this can also be used to determine calibration status. while resetn is low, the output clock (clkoutp/clkoutn) is set low. normal operation of the output clock resumes at the next input clock edge (clkp/clkn) after resetn is de-asserted. at 250msps the nominal calibrati on time is 200ms, while the maximum calibration time is 550ms. figure 18. a/d core block diagram digital error correction sha 1.25v inp inn clock generation 2.5- bit flash 6- stage 1.5-bit/ stage 3- stage 1- bit/ stage 3- bit flash lvds/ lvcmos outputs + ? flash 2.5-bit
ISLA216P 16 fn7574.0 january 13, 2011 user initiated reset recalibration of the a/d can be initiated at any time by driving the resetn pin low for a minimum of one clock cycle. an open-drain driver with a drive strength in its high impedance state of less than 0.5ma is re commended, as resetn has an internal high impedance pull-up to ovdd. as is the case during power-on reset, resetn and dnc pins must be in the proper state for the calibration to successfully execute. the performance of the ISLA216P 25 changes with variations in temperature, supply voltage or sample rate. the extent of these changes may necessitate recalibr ation, depending on system performance requirements. best performance will be achieved by recalibrating the a/d under th e environmental conditions at which it will operate. a supply voltage variation of <100mv will generally result in an snr change of <0. 5dbfs and sfdr change of <3dbc. in situations where the sample rate is not constant, best results will be obtained if the device is calibrated at the highest sample rate. reducing the sample rate by less than 80msps will typically result in an snr change of <0 .5dbfs and an sfdr change of <3dbc. figures 20 through 25 show the effect of temperature on snr and sfdr performance with power on calibration performed at -40c, +25c, and +85c. each plot shows the variation of snr/sfdr across temperature after a single power on calibration at -40c, +25c an d +85c. best performance is typically achieved by a user-initi ated power on ca libration at the operating conditions, as stated earlier. however, it can be seen that performance drift with temp erature is not a very strong function of the temperature at wh ich the power on calibration is performed. figure 19. calibration timing clkp clkn clkoutp calibration begins calibration complete calibration time resetn cal_status bit temperature calibration figure 20. typical snr performance vs temperature, 250msps operation, f in =105mhz figure 21. typical sfdr performance vs temperature, 250msps operation, f in =105mhz figure 22. typical snr performance vs temperature, 200msps operation, f in =105mhz figure 23. typical sfdr performance vs temperature, 200msps operation, f in =105mhz 70 71 72 73 74 75 76 77 -40-20 0 20406080 temperature (c) snr (dbfs) cal done at +25 cal done at +85 cal done at -40 65 70 75 80 85 90 95 -40-20 0 20406080 temperature (c) sfdr (dbc) cal done at +25 cal done at +85 cal done at -40 75.5 76.0 76.5 77.0 77.5 78.0 -40-20 0 20406080 temperature (c) snr (dbfs) cal done at +25 cal done at +85 cal done at -40 75 80 85 90 95 100 -40-20 0 20406080 temperature (c) sfdr (dbc) cal done at +25 cal done at +85 cal done at -40
ISLA216P 17 fn7574.0 january 13, 2011 analog input a single fully differential inpu t (vinp/vinn) connects to the sample and hold amplifier (sha) of each unit a/d. the ideal full-scale input voltage is 2.0v, centered at the vcm voltage of 0.94v as shown in figure 26. best performance is obtained when the analog inputs are driven differentially. the common-mode ou tput voltage, vcm, should be used to properly bias the inputs as shown in figures 27 through 29. an rf transformer will give the best noise and distortion performance for wideband and/or high intermediate frequency (if) inputs. two different transformer input schemes are shown in figures 27 and 28. this dual transformer scheme is used to improve common-mode rejection, which keeps the co mmon-mode level of the input matched to vcm. the value of the shunt resistor should be determined based on the desired load impedance. the differential input resistan ce of the ISLA216P25 is 300 . the sha design uses a switched capacitor input stage (see figure 42), which creates current spikes when the sampling capacitance is reconnected to th e input voltage. this causes a disturbance at the input which must settle before the next sampling point. lower source impedance will result in faster settling and improved performance. therefore a 2:1 or 1:1 transformer and low shunt resi stance are recommended for optimal performance. a differential amplifier, as show n in the simplified block diagram in figure 29, can be used in applications that require dc-coupling. in this configuratio n, the amplifier will typically dominate the achievable snr and distortion performance. figure 24. typical snr perf ormance vs temperature, 130msps operation, f in =105mhz figure 25. typical sfdr performance vs temperature, 130msps operation, f in =105mhz temperature calibration (continued) 75 76 77 78 79 80 -40-20 0 20406080 cal done at +25 cal done at +85 cal done at -40 temperature (c) snr (dbfs) 80 81 82 83 84 85 86 87 88 -40-20 0 20406080 temperature (c) sfdr (dbc) cal done at +25 cal done at +85 cal done at -40 figure 26. analog input range 1.0 1.8 0.6 0.2 1.4 vinp vinn vcm 0.94v 1.0v figure 27. transformer input for general purpose applications adt1-1wt 0.1f a/d vcm adt1-1wt 1000pf figure 28. transmission-line transformer input for high if applications a/d vcm 1000pf 1000pf tx-2-5-1 adtl1-12 figure 29. differential amplifier input a/d
ISLA216P 18 fn7574.0 january 13, 2011 intersil?s new isl552xx differential amplifier family can also be used in certain ac applicatio ns with minimal performance degradation. contac t the factory for more information. clock input the clock input circuit is a differential pair (see figure 43). driving these inputs with a high level (up to 1.8v p-p on each input) sine or square wave will provide the lowest jitter performance. a transformer with 4:1 impedance ratio will provide increased drive levels. the clock input is functional with ac-coupled lvds, lvpecl, and cml drive levels. to maintain the lowest possible aperture jitter, it is recommended to have high slew rate at the zero crossing of the differential clock input signal. the recommended drive circuit is shown in figure 30. a duty range of 40% to 60% is accept able. the clock can be driven single-ended, but this will reduce the edge rate and may impact snr performance. the clock inputs are internally self-biased to avdd/2 to facilitate ac coupling. jitter in a sampled data system, cloc k jitter directly impacts the achievable snr performance. the theoretical relationship between clock jitter (t j ) and snr is shown in equation 1 and is illustrated in figure 31. this relationship shows the snr that would be achieved if clock jitter were the only non-ideal factor. in reality, achievable snr is limited by internal factors such as linearity, aperture jitter and thermal noise. internal aperture jitter is the uncertainty in the sampling instant shown in figure 1a. the internal aperture jitter combines with the input clock jitt er in a root-sum-square fashion, since they are not statistically correlated, and this determines the total jitter in the system. the total jitter, combined with other noise sources, then determines the achievable snr. voltage reference a temperature compensated internal voltage reference provides the reference charges used in the successive approximation operations. the full-scale range of each a/d is proportional to the reference voltage. the nominal value of the voltage reference is 1.25v. digital outputs output data is available as a parallel bus in lvds-compatible(default) or cmos modes. in either case, the data is presented in double data rate (ddr) format. figures 1a and 1b show the timing relationships for lvds and cmos modes, respectively. additionally, the drive current for lvds mode can be set to a nominal 3ma(default) or a power-saving 2ma. the lower current setting can be used in designs where the receiver is in close physical proximity to the a/d. the applicability of this setting is dependent upon the pcb layout, therefore the user should experiment to determine if performance degradation is observed. the output mode can be controlled through the spi port, by writing to address 0x73, see ?serial peripheral interface? on page 22. an external resistor creates the bias for the lvds drivers. a 10k , 1% resistor must be connected from the rlvds pin to ovss. power dissipation the power dissipated by the ISLA216P25 is primarily dependent on the sample rate and the output modes: lvds vs cmos and ddr vs sdr. there is a static bias in the analog supply, while the remaining power dissipation is linearly related to the sample rate. the output supply dissipation changes to a lesser degree in lvds mode, but is more strongly related to the clock frequency in cmos mode. nap/sleep portions of the device may be shut down to save power during times when operation of the a/d is not required. two power saving modes are available: nap, and sleep. nap mode reduces power dissipation to <103mw while sleep mode reduces power dissipation to <19mw. all digital outputs (data, clkout and or) are placed in a high impedance state during nap or sleep. the input clock should remain running and at a fixed fr equency during nap or sleep, and csb should be high. recovery time from nap mode will increase if the clock is stopped, since the internal dll can take up to 52s to regain lock at 250msps. by default after the device is powered on, the operational state is controlled by the napslp pin as shown in table 1. figure 30. recommended clock drive tc4-19g2+ 1000pf 1000pf clkp clkn 0.01f 200 1000pf snr 20 log 10 1 2 f in t j ------------------- ?? ?? = (eq. 1) figure 31. snr vs clock jitter tj = 100ps tj = 10ps tj = 1ps tj = 0.1ps 10 bits 12 bits 14 bits 50 55 60 65 70 75 80 85 90 95 100 1m 10m 100m 1g snr (db) input frequency (hz)
ISLA216P 19 fn7574.0 january 13, 2011 the power-down mode can also be controlled through the spi port, which overrides the napslp pin setting. details on this are contained in ?serial peripheral interface? on page 22. data format output data can be presented in three formats: two?s complement(default), gray code and offset binary. the data format can also be controlled through the spi port, by writing to address 0x73. details on this are contained in ?serial peripheral interface? on page 22. offset binary coding maps the most negative input voltage to code 0x000 (all zeros) and the mo st positive input to 0xfff (all ones). two?s complement coding simply complements the msb of the offset binary representation. when calculating gray code the msb is unchanged. the remaining bits are computed as the xor of the current bit position and the next most significant bit. figure 32 shows this operation. converting back to offset binary from gray code must be done recursively, using the result of each bit for the next lower bit as shown in figure 33. mapping of the input voltage to the various data formats is shown in table 2. clock divider synchronous reset an output clock (clkoutp, clkoutn) is provided to facilitate latching of the sampled data. this clock is at half the frequency of the sample clock, and the abso lute phase of the output clocks for multiple a/ds is indeterminate. this feature allows the phase of multiple a/ds to be synchronized (refer to figure 34), which greatly simplifies data capture in systems employing multiple a/ds. the reset signal must be well-ti med with respect to the sample clock (see ?switching specifications? on page 11). table 1. napslp pin settings napslp pin mode avss normal float sleep avdd nap figure 32. binary to gray code conversion 14 15 13 0 1 binary 14 15 13 0 gray code ? ? ? ? ? ? ? ? ? ? ? ? 1 table 2. input voltage to output code mapping input voltage offset binary two?s complement gray code ?full scale 0000 0000 0000 0000 1000 0000 0000 0000 0000 0000 0000 0000 ?full scale + 1lsb 0000 0000 0000 0001 1000 0000 0000 0001 0000 0000 0000 0001 mid?scale 1000 0000 0000 0000 0000 0000 0000 0000 1100 0000 0000 0000 +full scale ? 1lsb 1111 1111 1111 1110 0111 1111 1111 1110 1000 0000 0000 0001 +full scale 1111 1111 1111 1111 0111 1111 1111 1111 1000 0000 0000 0000 14 15 13 0 1 binary 14 15 13 0 gray code ? ? ? ? ? ? ? ? ? ? ? ? 1 ? ? ? ?
ISLA216P 20 fn7574.0 january 13, 2011 figure 34. synchronous reset operation s1 s2 s0 s3 s1 s2 s0 s3 clkdivrstp adc1 output data adc1 clkoutp adc2 clkoutp (phase 1) adc2 clkoutp (phase 2) s1 l+t d t rsth t rsts t rstrt adc2 output data analog input sample clock input s2 notes: 13. delay equals fixed pipeline latency (l cycl es) plus fixed analog propagation delay td. 14. clkdivrstp setup and hold times are with respect to input sample clock rising edge. clkdivrstn is not shown, but must be dr iven, and is the compliment of clkdivrstp. 15. either output clock phase (phase 1 or phase 2 ) equally likely prior to synchronization. (note 15) (note 14) (note 14) (note 13)
ISLA216P 21 fn7574.0 january 13, 2011 figure 35. msb-first addressing csb sclk sdio r/w w1 w0 a12 a11 a1 a0 d7 d6 d5 d4 d3 d2 d1 d0 a10 figure 36. lsb-first addressing csb sclk sdio r/w w1 w0 a12 a11 a1 a0 d7 d6 d5 d4 d3 d2 d1 d0 a2 figure 37. spi write t s t hi t clk t lo r/w w1 w0 a12 a11 a10 a9 a8 a7 d5 d4 d3 d2 d1 d0 t h t dhw t dsw spi write csb sclk sdio figure 38. spi read (3 wire mode ) (4 wire mode ) w1 w 0 a 1 2 a9 a2 a1 d7 d6 d3 d2 d1 d7 d3 d2 d1 d0 a0 writing a read command reading data d0 t h t dvr spi read t hi t clk t lo t dhw t dsw t s csb sclk sdio sdo a11 a10 r/w
ISLA216P 22 fn7574.0 january 13, 2011 serial peripheral interface a serial peripheral interface (spi) bus is used to facilitate configuration of the device and to optimize performance. the spi bus consists of chip select (csb), serial clock (sclk) serial data output (sdo), and serial data input/output (sdio). the maximum sclk rate is equal to the a/d sample rate (f sample ) divided by 16 for both write operations and read operations. at f sample = 250mhz, maximum sclk is 15.6 3mhz for writing and read operations. there is no minimum sclk rate. the following sections describe various registers that are used to configure the spi or adjust perfor mance or functional parameters. many registers in the available address space (0x00 to 0xff) are not defined in this document. additionally, within a defined register there may be certain bits or bit combinations that are reserved. undefined registers and undefined values within defined registers are reserved and should not be selected. setting any reserved register or value may produce indeterminate results. spi physical interface the serial clock pin (sclk) provid es synchronization for the data transfer. by default, all data is presented on the serial data input/output (sdio) pin in three-wire mode. the state of the sdio pin is set automatically in the communication protocol (described in the following). a dedicated serial data output pin (sdo) can be activated by setting 0x00[7] high to allow operation in four-wire mode. the spi port operates in a half duplex master/slave configuration, with the ISLA216P25 functioning as a slave. multiple slave devices can inte rface to a single master in three-wire mode only, since the sdo output of an unaddressed device is asserted in four wire mode. the chip-select bar (csb) pin determines when a slave device is being addressed. multiple slav e devices can be written to concurrently, but only one slave device can be read from at a given time (again, only in three-wire mode). if multiple slave devices are selected for reading at the same time, the results will be indeterminate. the communication protocol begins with an instruction/address phase. the first rising sclk edge following a high-to-low transition on csb determines the beginning of the two-byte instruction/address command; sclk must be static low before the csb transition. data can be presented in msb-first order or lsb-first order. the default is msb-first, but this can be changed by setting 0x00[6] high. figure s 35 and 36 show the appropriate bit ordering for the msb-first and lsb-first modes, respectively. in msb-first mode, the address is incremented for multi-byte transfers, while in lsb-fi rst mode it?s decremented. in the default mode, the msb is r/w, which determines if the data is to be read (active high) or written. the next two bits, w1 and w0, determine the number of data bytes to be read or written (see table 3). the lower 13 bits contain the first address for the data transfer. this relationship is illustrated in figure 37, and timing values are given in ?switching specifications boldface limit s apply over the operating temperature range, -40c to +85c.? on page 11. after the instruction/address bytes have been read, the appropriate number of data bytes are written to or read from the a/d (based on the r/w bit status). the data transfer will continue as long as csb remains low and sclk is active. stalling of the csb pin is allowed at any byte boundary (instruction/address or data) if the number of bytes being transferred is three or less. for transfers of four bytes or more, csb is allowed to stall in the middle of the instruction/address bytes or before the first data byte. if csb transitions to a high state after that point the state machine will reset and terminate the data transfer. figure 39. 2-byte transfer csb sclk sdio instruction/address data word 1 data word 2 csb stalling figure 40. n-byte transfer csb sclk sdio instruction/address data word 1 data word n last legal csb stalling
ISLA216P 23 fn7574.0 january 13, 2011 figures 39 and 40 illustrate the timing relationships for 2-byte and n-byte transfers, respective ly. the operation for a 3-byte transfer can be inferred from these diagrams. spi configuration address 0x00: chip_port_config bit ordering and spi reset are contro lled by this register. bit order can be selected as msb to lsb (m sb first) or lsb to msb (lsb first) to accommodate various micro controllers. bit 7 sdo active bit 6 lsb first setting this bit high configures the spi to interpret serial data as arriving in lsb to msb order. bit 5 soft reset setting this bit high resets all spi registers to default values. bit 4 reserved this bit should always be set high. bits 3:0 these bits should always mirror bits 4:7 to avoid ambiguity in bit ordering. address 0x02: burst_end if a series of sequential register s are to be set, burst mode can improve throughput by eliminating redundant addressing. in 3-wire spi mode, the burst is ended by pulling the csb pin high. if the device is operated in 2-wire mode the csb pin is not available. in that case, setting the burst_end address determines the end of the transfer. during a write operation, the user must be cautious to transmit the corre ct number of bytes based on the starting and ending addresses. bits 7:0 burst end address this register value determines the ending address of the burst data . device information address 0x08: chip_id address 0x09: chip_version the generic die identifier and a revision number, respectively, can be read from these two registers. device configuration/control a common spi map, which can accommodate single-channel or multi-channel devices, is used for all intersil a/d products. address 0x20: offset_coarse_adc0 address 0x21: offset_fine_adc0 the input offset of the a/d core can be adjusted in fine and coarse steps. both adjustments are made via an 8-bit word as detailed in table 4. the data format is twos complement. the default value of each register will be the result of the self-calibration after initial power-up. if a register is to be incremented or decremented, the user should first read the register value then write the incremented or decremented value back to the same register. address 0x22: gain_coarse_adc0 address 0x23: gain_medium_adc0 address 0x24: gain_fine_adc0 gain of the a/d core can be adjusted in coarse, medium and fine steps. coarse gain is a 4-bit adjustment while medium and fine are 8-bit. multiple coarse gain bits can be set for a total adjustment range of 4.2%. (?0011? ? -4.2% and ?1100? ? +4.2%) it is recommended to use one of the coarse gain settings (-4.2%, -2.8%, -1.4%, 0, 1.4%, 2.8%, 4.2%) and fine-tune the gain using the registers at 0x0023 and 0x24. the default value of each register will be the result of the self-calibration after initial power-up. if a register is to be incremented or decremented, the user should first read the register value then write the incremented or decremented value back to the same register. table 3. byte transfer selection [w1:w0] bytes transferred 00 1 01 2 10 3 11 4 or more table 4. offset adjustments parameter 0x20[7:0] coarse offset 0x21[7:0] fine offset steps 255 255 ?full scale (0x00) -133lsb (-47mv) -5lsb (-1.75mv) mid?scale (0x80) 0.0lsb (0.0mv) 0.0lsb +full scale (0xff) +133lsb (+47mv) +5lsb (+1.75mv) nominal step size 1.04lsb (0.37mv) 0.04lsb (0.014mv) table 5. coarse gain adjustment 0x22[3:0] core 0 0x26[3:0] core 1 nominal coarse gain adjust (%) bit3 +2.8 bit2 +1.4 bit1 -2.8 bit0 -1.4
ISLA216P 24 fn7574.0 january 13, 2011 address 0x25: modes two distinct reduced power modes can be selected. by default, the tri-level napslp pin can sele ct normal operation, nap or sleep modes (refer to?nap/sleep? on page 18). this functionality can be overridden and controlled through the spi. this is an indexed function when controlled from the spi, but a global function when driven from the pin. this register is not changed by a soft reset. address 0x26: offset_coarse_adc1 address 0x27: offset_fine_adc1 the input offset of a/d core#1 can be adjusted in fine and coarse steps in the same way that offset for core#0 can be adjusted. both adjustments are made via an 8-bit word as detailed in table 4. the data format is two?s complement. the default value of each register will be the result of the self-calibration after initial power-up. if a register is to be incremented or decremented, the user should first read the register value then write the incremented or decremented value back to the same register. address 0x28: gain_coarse_adc1 address 0x29: gain_medium_adc1 address 0x2a: gain_fine_adc1 gain of a/d core #1 can be adjusted in coarse, medium and fine steps in the same way that core #0 can be adjusted. coarse gain is a 4-bit adjustment while medium and fine are 8-bit. multiple coarse gain bits can be set for a total adjustment range of 4.2. global device configuration/control address 0x71: phase_slip the output data clock is generated by dividing down the a/d input sample clock. some systems with mu ltiple a/ds can more easily latch the data from each a/d by controlling the phase of the output data clock. this control is accomplished through the use of the phase_slip spi feature, which allows the rising ed ge of the output data clock to be advanced by one input clock period, as shown in the figure 41. execution of a phase_slip command is accomplished by first writing a '0' to bit 0 at address 0x71, followed by writing a '1' to bit 0 at address 0x71. address 0x72: clock_divide the ISLA216P25 has a selectable cl ock divider that can be set to divide by two or one (no division). by default, the tri-level clkdiv pin selects the divisor this func tionality can be overridden and controlled through the spi, as shown in table 8. this register is not changed by a soft reset. address 0x73: output_mode_a the output_mode_a register controls the physical output format of the data, as well as the lo gical coding. the ISLA216P25 can present output data in two physical formats: lvds(default) or lvcmos. additionally, the drive strength in lvds mode can be set high (default,3ma or low (2ma). data can be coded in three possible formats: two?s complement(default), gray code or offset binary. see table 10. this register is not changed by a soft reset. table 6. medium and fine gain adjustments parameter 0x23[7:0] medium gain 0x24[7:0] fine gain steps 256 256 ?full scale (0x00) -2% -0.20% mid?scale (0x80) 0.00% 0.00% +full scale (0xff) +2% +0.2% nominal step size 0.016% 0.0016% table 7. power-down control value 0x25[2:0] power down mode 000 pin control 001 normal operation 010 nap mode 100 sleep mode table 8. clock divider selection value 0x72[2:0] clock divider 000 pin control 001 divide by 1 010 divide by 2 other not allowed table 9. output mode control value 0x73[7:5] output mode 000 lvds 3ma (default) 001 lvds 2ma 100 lvcmos figure 41. phase slip adc input clock (500mhz) output data clock (250mhz) no clock_slip output data clock (250mhz) 1 clock_slip output data clock (250mhz) 2 clock_slip 2ns 4ns 2ns
ISLA216P 25 fn7574.0 january 13, 2011 address 0x74: output_mode_b address 0x75: config_status bit 6 dll range this bit sets the dll operating ra nge to fast (default) or slow. internal clock signals are generate d by a delay-locked loop (dll), which has a finite operating range. table 11 shows the allowable sample rate ranges for the slow and fast settings. address 0xb6: calibration status the lsb at address 0xb6 can be read to determine calibration status. the bit is ?0? during calibration and goes to a logic ?1? when calibration is complete.this register is unique in that it can be read after por at calibration, unlike the other registers on chip, which can?t be read until calibration is complete. device test the ISLA216P25 can produce preset or user defined patterns on the digital outputs to facilitate in -situ testing. a user can pick from preset built-in patterns by writing to the output test mode field [7:4] at 0xc0 or user defined patterns by writing to the user test mode field [2:0] at 0xc0. the user defined patterns should be loaded at addre ss space 0xc1 through 0xd0, see the ?spi memory map? on page 27 for more detail.the predefined patterns are shown in table 12. the test mode is enabled asynchronously to the sample clock, therefore several sample clock cycles may elapse before the data is present on the output bus. address 0xc0: test_io bits 7:4 output test mode these bits set the test mode according to table 12. other values are reserved.user test pa tterns loaded at 0xc1 through 0xd0 are also available by writing ?1000? to [7:4] at 0xc0 and a pattern depth value to [2:0] at 0xc0. see ?spi memory map? on page 27. bits 2:0 user test mode the three lsbs in this register determine the test pattern in combination with registers 0xc1 through 0xd0. refer to the ?spi memory map? on page 27. address 0xc1: user_patt1_lsb address 0xc2: user_patt1_msb these registers define the lower and upper eight bits, respectively, of the user-defined pattern 1. address 0xc3: user_patt2_lsb address 0xc4: user_patt2_msb these registers define the lower and upper eight bits, respectively, of the user-defined pattern 2 address 0xc5: user_patt3_lsb address 0xc6: user_patt3_msb these registers define the lower and upper eight bits, respectively, of the user-defined pattern 3 address 0xc7: user_patt4_lsb address 0xc8: user_patt4_msb these registers define the lower and upper eight bits, respectively, of the user-defined pattern 4. address 0xc9: user_patt5_lsb address 0xca: user_patt5_msb these registers define the lower and upper eight bits, respectively, of the user-defined pattern 5. address 0xcb: user_patt6_lsb address 0xcc: user_patt6_msb these registers define the lower and upper eight bits, respectively, of the user-defined pattern 6 address 0xcd: user_patt7_lsb address 0xce: user_patt7_msb these registers define the lower and upper eight bits, respectively, of the user-defined pattern 7. table 10. output format control value 0x73[2:0] output format 000 two?s complement (default) 010 gray code 100 offset binary table 11. dll ranges dll range min max unit slow 40 100 msps fast 80 250 msps table 12. output test modes value 0xc0[7:4] output test mode word 1 word 2 0000 off 0001 midscale 0x8000 n/a 0010 positive full-scale 0xffff n/a 0011 negative full-scale 0x0000 n/a 0100 reserved n/a n/a 0101 reserved n/a n/a 0110 reserved n/a n/a 0111 reserved 1000 user pattern user_patt1 user_patt2 1001 reserved n/a n/a 1010 ramp n/a n/a
ISLA216P 26 fn7574.0 january 13, 2011 address 0xcf: user_patt8_lsb address 0xd0: user_patt8_msb these registers define the lower and upper eight bits, respectively, of the user-defined pattern 8. digital temperature sensor address 0x4b: temp_counter_high bits [2:0] of this register hold the 3 msbs of the 11-bit temperature code. bit [7] of this register indicate s a valid temperature_counter read was performed. a logic ?1? indicates a valid read. address 0x4c: temp_counter_low bits [7:0] of this register hold the lower 8 lsbs of the 11-bit temperature code. address 0x4d: temp_counter_control bit [7] measurement mode select bit, set to ?1? for recommended ptat mode. ?0? (default) is iptat mode and is less accurate and not recommended. bit [6] temperature counter enable bit. set to ?1? to enable. bit [5] temperature counter power down bit. set to ?1? to power-down temperature counter. bit [4] temperature counter reset bit. set to ?1? to reset count. bit [3:1] three bit frequency divider field. sets temperature counter update rate. update rate is proportional to adc sample clock rate and divide ratio. a ?101? updates the temp counter every ~ 66s (for 250msps). faster updates rates result in lower precision. bit [0] select sampler bit. set to ?0?. this set of registers provides digital access to an ptat or iptat-based temperature sensor , allowing the system to estimate the temperature of the die, allowing easy access to information that can be used to decide when to recalibrate the a/d as needed. the nominal transfer function of the temperature counter is codes (in decimal) = 0.56*t(c) + 618. this corresponds to approximately a 65 lsb increase from -40 to +85c. a typical temperature measur ement can occur as follows: 1. write ?0xca? to address 0x4d - enable temp counter, divide=?101? 2. wait 132s (at 250msps) - longer wait time ensures the sensor completes one valid cycle. 3. write ?0x20? to address 0x4d - power down, disable temp counter-recommended between measurements. this ensures that the output does not change between msb and lsb reads. 4. read address 0x4b (msbs) 5. read address 0x4c (lsbs) 6. record temp code value 7. write ?0x20? to address 0x4d - power-down, disable temp counter. contact the factory fo r more information if needed.
ISLA216P 27 fn7574.0 january 13, 2011 spi memory map addr. (hex) parameter name bit 7 (msb) bit 6 bi t 5 bit 4 bit 3 bit 2 bit 1 bit 0 (lsb) def. value (hex) spi config/control 00 port_config sdo active lsb first soft reset mirror (bit5) mirror (bit6) mirror (bit7) 00h 01 reserved reserved 02 burst_end burst end address [7:0] 00h 03-07 reserved reserved dut info 08 chip_id chip id # read only 09 chip_version chip version # read only 0a-0f reserved reserved device config/control 10-1f reserved reserved 20 offset_coarse_adc0 coarse offset cal. value 21 offset_fine_adc0 fine offset cal. value 22 gain_coarse_adc0 reserved coarse gain cal. value 23 gain_medium_adc0 medium gain cal. value 24 gain_fine_adc0 fine gain cal. value 25 modes_adc0 reserved power down mode adc0 [2:0] 000 = pin control 001 = normal operation 010 = nap 100 = sleep other codes = reserved 00h not reset by soft reset 26 offset_coarse_adc1 coarse offset cal. value 27 offset_fine_adc1 fine offset cal. value 28 gain_coarse_adc1 reserved coarse gain cal. value 29 gain_medium_adc1 medium gain cal. value 2a gain_fine_adc1 fine gain cal. value 2b modes_adc1 reserved power down mode adc1 [2:0] 000 = pin control 001 = normal operation 010 = nap 100 = sleep other codes = reserved 00h not reset by soft reset 2c-2f reserved reserved 33-4a reserved reserved 4b temp_counter_high temp counter [10:8] read only 4c temp_counter_low temp counter [7:0] read only 4d temp_counter_control enable pd reset divider [2:0] select 00h 4e-6f reserved reserved 70 skew_diff differential skew 80h 71 phase_slip reserved next clock edge 00h 72 clock_divide clock divide [2:0] 000 = pin control 001 = divide by 1 010 = divide by 2 100 = divide by 4 other codes = reserved 00h not reset by soft reset
ISLA216P 28 fn7574.0 january 13, 2011 device config/control 73 output_mode_a output mode [7:5] 000 = lvds 3ma (default) 001 = lvds 2ma 100 = lvcmos other codes = reserved output format [2:0] 000 = two?s complement (default) 010 = gray code 100 = offset binary other codes = reserved 00h not reset by soft reset 74 output_mode_b dll range 0 = fast 1 = slow default=?0? 00h not reset by soft reset 75-b5 reserved reserved b6 cal_status calibration done read only b7-bf reserved device test c0 test_io output test mode [7:4] user test mode [2:0] 0 = user pattern 1 only 1 = cycle pattern 1,3 2 = cycle pattern 1,3,5 3 = cycle pattern 1,3,5,7 4-7 = na 00h 0 = off (note 14) 1 = midscale short 2 = +fs short 3 = -fs short 4 = reserved (note15) 5-6 = reserved 7 = reserved (note16) 8 = user pattern (1 to 4 deep) 9 = reserved 10 = ramp 11-15 = reserved c1 user_patt1_lsb b7 b6 b5 b4 b3 b2 b1 b0 0x00 c2 user_patt1_msb b15 b14 b13 b12 b11 b10 b9 b8 00h c3 user_patt2_lsb b7 b6 b5 b4 b3 b2 b1 b0 00h c4 user_patt2_msb b15 b14 b13 b12 b11 b10 b9 b8 00h c5 user_patt3_lsb b7 b6 b5 b4 b3 b2 b1 b0 00h c6 user_patt3_msb b15 b14 b13 b12 b11 b10 b9 b8 00h c7 user_patt4_lsb b7 b6 b5 b4 b3 b2 b1 b0 00h c8 user_patt4_msb b15 b14 b13 b12 b11 b10 b9 b8 00h c9 user_patt5_lsb b7 b6 b5 b4 b3 b2 b1 b0 00h ca user_patt5_msb b15 b14 b13 b12 b11 b10 b9 b8 00h cb user_patt6_lsb b7 b6 b5 b4 b3 b2 b1 b0 00h cc user_patt6_msb b15 b14 b13 b12 b11 b10 b9 b8 00h cd user_patt7_lsb b7 b6 b5 b4 b3 b2 b1 b0 00h ce user_patt7_msb b15 b14 b13 b12 b11 b10 b9 b8 00h cf user_patt8_lsb b7 b6 b5 b4 b3 b2 b1 b0 00h d0 user_patt8_msb b15 b14 b13 b12 b11 b10 b9 b8 00h d1-ff reserved reserved notes: 14. during calibration xcccc (msb justified) is presented at the ou tput data bus, toggling on the lsb (and higher) data bits occ urs at completion of calibration. this behavior can be used as an option to determine calibration state. 15. use test_io = 0x80 and user pattern 1 = 0x9999 for checkerboard outputs on ddr outputs. 16. use test_io = 0x80 and user pattern 1 = 0xaa aa for all ones/zeroes outputs on ddr outputs. spi memory map (continued) addr. (hex) parameter name bit 7 (msb) bit 6 bi t 5 bit 4 bit 3 bit 2 bit 1 bit 0 (lsb) def. value (hex)
ISLA216P 29 fn7574.0 january 13, 2011 equivalent circuits figure 42. analog inputs figure 43. clock inputs figure 44. tri-level digital inputs figure 45. digital inputs figure 46. lvds outputs figure 47. cmos outputs avdd inp inn avdd csamp 9pf csamp 9pf to charge pipeline to charge pipeline e1 e3 e3 e2 e2 e1 300 avdd clkp clkn avdd avdd to clock-phase generation avdd 11k 18k 11k 18k avdd input avdd avdd avdd to sense logic 75k 75k 75k 75k 280 input ovdd ovdd 280 to logic 20k ovdd (20k pull-up on resetn only) d[14:0]p ovdd ovdd 2ma or 3ma 2ma or 3ma data data data data d[14:0]n ovdd d[14:0] ovdd ovdd data
ISLA216P 30 fn7574.0 january 13, 2011 a/d evaluation platform intersil offers an a/d evaluation platform which can be used to evaluate any of intersil?s high speed a/d products. the platform consists of a fpga based data capture motherboard and a family of a/d daughtercards. this usb based platform allows a user to quickly evaluate the a/d?s performance at a user?s specific application frequency requirem ents. more information is available at http://www.intersil.com/converters/adc_eval_platform/ layout considerations split ground and power planes data converters operating at high sampling frequencies require extra care in pc board layout. many complex board designs benefit from isolating the analog and digital sections. analog supply and ground planes should be laid out under signal and clock inputs. locate the digital planes under outputs and logic pins. grounds should be joined under the chip. clock input considerations use matched transmission lines to the transformer inputs for the analog input and clock signals. locate transformers and terminations as close to the chip as possible. exposed paddle the exposed paddle must be electrically connected to analog ground (avss) and should be connected to a large copper plane using numerous vias for op timal thermal performance. bypass and filtering bulk capacitors should have lo w equivalent series resistance. tantalum is a good choice. for best performance, keep ceramic bypass capacitors very close to device pins. longer traces will increase inductance, resulting in diminished dynamic performance and accuracy. make sure that connections to ground are direct and low impedance. avoid forming ground loops. lvds outputs output traces and connections must be designed for 50 (100 differential) characteristic impe dance. keep traces direct and minimize bends where possible. avoid crossing ground and power-plane breaks with signal traces. lvcmos outputs output traces and connections must be designed for 50 characteristic impedance. unused inputs standard logic inputs (resetn, csb, sclk, sdio, sdo) which will not be operated do not require co nnection to ensure optimal a/d performance. these inputs can be left floating if they are not used. tri-level inputs (napslp) accept a floating input as a valid state, and therefore should be biased according to the desired functionality. definitions analog input bandwidth is the analog input frequency at which the spectral output power at the fundamental frequency (as determined by fft analysis) is reduced by 3db from its full-scale low-frequency value. this is also referred to as full power bandwidth. aperture delay or sampling delay is the time required after the rise of the clock input for the sa mpling switch to open, at which time the signal is held for conversion. aperture jitter is the rms variation in aperture delay for a set of samples. clock duty cycle is the ratio of the time the clock wave is at logic high to the total time of one clock period. differential non-linearity (dnl) is the deviation of any code width from an ideal 1 lsb step. figure 48. vcm_out output equivalent circuits (continued) vcm avdd 0.94v + ?
ISLA216P 31 intersil products are manufactured, assembled and tested utilizing iso9000 quality systems as noted in the quality certifications found at www.intersil.com/design/quality intersil products are sold by description only. intersil corporat ion reserves the right to make changes in circuit design, soft ware and/or specifications at any time without notice. accordingly, the reader is cautioned to verify that data sheets are current before placing orders. information furnished by intersil is believed to be accurate and reliable. however, no responsi bility is assumed by intersil or its subsid iaries for its use; nor for any infringem ents of patents or other rights of third parties which may result from its use. no license is granted by implication or otherwise under any patent or patent rights of i ntersil or its subsidiaries. for information regarding intersil corporation and its products, see www.intersil.com fn7574.0 january 13, 2011 for additional products, see www.intersil.com/product_tree effective number of bits (enob) is an alternate method of specifying signal to noise-and-distortion ratio (sinad). in db, it is calculated as: enob = (sinad - 1.76)/6.02 gain error is the ratio of the difference between the voltages that cause the lowest and highest code transitions to the full-scale voltage less than 2 lsb. it is typically expressed in percent. i2e the intersil interleave engine. this highly configurable circuitry performs estimates of offset, gain, and sample time skew mismatches between the core converters, and updates analog adjustments for each to minimize interleave spurs. integral non-linearity (inl) is the maximum deviation of the a/d?s transfer function from a best fit line determined by a least squares curve fit of that transfer function, measured in units of lsbs. least significant bit (lsb) is the bit that has the smallest value or weight in a digital word. its value in terms of input voltage is v fs /(2 n -1) where n is the resolution in bits. missing codes are output codes that are skipped and will never appear at the a/d output. thes e codes cannot be reached with any input value. most significant bit (msb) is the bit that has the largest value or weight. pipeline delay is the number of clock cycles between the initiation of a conversion and th e appearance at the output pins of the data. power supply rejection ratio (psrr) is the ratio of the observed magnitude of a spur in the a/d fft, caused by an ac signal superimposed on the power supply voltage. signal to noise-and-distortion (sinad) is the ratio of the rms signal amplitude to the rms sum of all other spectral components below one half the clock frequency, including harmonics but excluding dc. signal-to-noise ratio (without harmonics) is the ratio of the rms signal amplitude to the rms sum of all other spectral components below one-half the sampling frequency, excluding harmonics and dc. snr and sinad are either given in units of db when the power of the fundamental is used as the reference, or dbfs (db to full scale) when the converter?s full-scale input power is used as the reference. spurious-free-dynamic range (sfdr) is the ratio of the rms signal amplitude to the rms value of the largest spurious spectral component. the largest spurious spectral component may or may not be a harmonic. products intersil corporation is a leader in the design and manufacture of high-performance analog semico nductors. the company's product s address some of the industry's fastest growing markets, such as , flat panel displays, cell phones, handheld products, and noteb ooks. intersil's product families address power management and analog sign al processing functions. go to www.intersil.com/products for a complete list of intersil product families. *for a complete listing of applications, related documentation an d related parts, please see the respective device information page on intersil.com: ISLA216P to report errors or suggestions for this datasheet, please go to: www.intersil.com/askourstaff fits are available from our website at: http://rel.intersil.com/reports/sear revision history the revision history provided is for inform ational purposes only and is believed to be accurate, but not warranted. please go t o web to make sure you have the latest rev. date revision change 1/13/11 fn7574.0 initial release
ISLA216P 32 fn7574.0 january 13, 2011 package outline drawing l72.10x10e 72 lead quad flat no-lead plastic package rev 0, 11/09 72 exposed 1 8.500 ref. (4x) 6.000 ref. 7.150 ref. 4.150 ref. 3.000 0.100 a mc b a 0.100 m c b 6 pin #1 index area pad area ref. located within the zone indicated. the pin #1 indentifier may be unless otherwise specified, tolerance : decimal 0.10 tiebar shown (if present) is a non-functional feature. the configuration of the pin #1 identifier is optional, but must be between 0.015mm and 0.30mm from the terminal tip. dimension applies to the metallized terminal and is measured dimensions in ( ) for reference only. dimensioning and tolerancing conform to ansi y14.5m-1994. 6. either a mold or mark feature. 3. 5. 4. 2. dimensions are in millimeters. 1. notes: bottom view detail "z" side view typical recommended land pattern top view 1 72 y 72 1 z r0.115 typ. r0.200 seating plane r0.200 max. all around 10.00 0.10 0.500 0.100 c0.190x45 (0.350) (1.500) 0.450 0.190~0.245 0.650 0.050 0.025 0.020 0.23 0.050 0.50 0.85 0.050 11 9.75 0.10 c 9.75 (4x) 0.15 index area 6 pin 1 10.00 a b 10.00 9.75 all around (4x 9.70) (4.15 ref) (4x 8.50) ( 72x 0 .23) ( 72x 0 .70) (7.15) (6.00) (3.00 ) c0.400x45 (4x) ( 0 . 1 2 5 a l l a r o u n d ) x a 0.100 c mb 0.050 m c c 0.080 0.100 c detail "x" detail "y" angular 2.50 package outline compliant to jesd-m0220. 7.

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